6 resultados para AUTOR: CHER-MING-TAN

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IBD ELECTROMIGRATION IN ULSI INTERCONNECTI..
PVP: 127,87
im.bajo demanda
IBD ELECTROMIGRATION MODELING AT CIRCUIT LAYOUT LEVEL
PVP: 68,06
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IBD RELIABILITY ANALYSIS OF ELECTROTECHNICAL DEVICES
PVP: 62,03
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