HIERARCHICAL MODELING FOR VLSI CIRCUIT TESTING

SPRINGER NATURE B.V.

HIERARCHICAL MODELING FOR VLSI CIRCUIT TESTING

DEBASHIS BHATTACHARYA / JOHN P. HAYES

Año edición: 26-09-2011

Colección:

EAN: 9781461288190

Idioma: INGLES

Situación im.bajo demanda

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HIERARCHICAL MODELING FOR VLSI CIRCUIT TESTING

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